Elemental Profile Studies of some Soil Samples using Particle Induced X-Ray Emission (PIXE) Technique
Authors: Shirin Akter, M. Monjur Ahasan, Md. Joynal Abedin, Rajada Khatun, Ashrafun Nahar Monika
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In this work Proton-Induced X-ray Emission (PIXE) technique has been employed for the determination of elemental concentration of soil samples. PIXE analyses have been carried out using a 2.5 MeV proton beam generated with the aid of the 3 MV tandem accelerator of the Institute Nuclear Science and Technology, Atomic Energy Research Establishment, Savar, Dhaka. The X-ray and particle spectra were processed using MAESTRO software and GUPIX software. The elements identified in the soil samples using PIXE were K: 6040.33, Ca: 2018.07, Ti: 3826.5, V: 188, Cr: 1472.22, Mn: 482.37, Fe: 33330.17, Co: 738.47, Ni: 480.95, Cu: 464.42 and Zn: 2144.93 ppm respectively. The legitimacy of the method was done by analyzing Standard Reference Material IAEA soil standard 2586 and found to be compatible. PIXE is a multi element systematic technique used for the determination of major, minor and trace elements in the range of parts per million (ppm).