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Peculiarities of Frenel Formulas Use for Calculating the Amplitude and Phase of Refracted and Reflected Plane Electromagnetic Waves at the Interface of Nanostructured Heterogeneous and Moistened Dispersed Media
Authors: Pavel Yu. Lukyanov, Sergey V. Tsyrenzhapov, Yuriy V. Kharin, Kseniya A. Schegrina
Number of views: 168
The peculiarities of using Fresnel formulas in various forms for calculating the refraction
and reflection of electromagnetic waves on a flat interface with allowance for specific effects, the
manifestation of which is expected in nanostructured heterogeneous and moistened dispersive
media, including those near the critical temperatures at the Widom line are discussed in the
article. Issues on the phase of reflected and refracted waves depending on the combination
of electromagnetic characteristics of media and geometric factors, as well as the question of the reflected wave phase change near the Brewster angle are considered. We suggest socalled
“intuitive” definition for equal phase of two plane electromagnetic waves propagating in
different directions, which makes it possible to simplify substantially the formulations of the rules
identifying the phase of electromagnetic waves reflected from the media interface.